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System-on-chip test architectures: nanometer design for testability
| Autor principal: | Wang, Laung-Terng (ed. by) |
|---|---|
| Altres autors: | Stround, Charles E. Touba, Nur A. |
| Format: | Printed Book |
| Idioma: | English |
| Publicat: |
Boston
Morgan Kaufmann
2008
|
| Matèries: |
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