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System-on-chip test architectures: nanometer design for testability
| Hovedforfatter: | |
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| Andre forfattere: | |
| Format: | Printed Book |
| Sprog: | English |
| Udgivet: |
Boston
Morgan Kaufmann
2008
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| Fag: |
UL
| Klassifikationsnummer: |
621.9 WAN |
|---|---|
| Kopi | Live Status Unavailable |