System-on-chip test architectures: nanometer design for testability

Bibliographic Details
Main Author: Wang, Laung-Terng (ed. by)
Other Authors: Stround, Charles E. Touba, Nur A.
Format: Printed Book
Language:English
Published: Boston Morgan Kaufmann 2008
Subjects:
Systems on a chip-Testing > Integrated circuits- very large scale integration- Testing

UL

Holdings details from UL
Call Number: 621.9 WAN
Copy Live Status Unavailable

Similar Items