Cargando...

System-on-chip test architectures: nanometer design for testability

Detalles Bibliográficos
Autor principal:	Wang, Laung-Terng (ed. by)
Otros Autores:	Stround, Charles E. Touba, Nur A.
Formato:	Printed Book
Lenguaje:	English
Publicado:	Boston Morgan Kaufmann 2008
Materias:	Systems on a chip-Testing > Integrated circuits- very large scale integration- Testing

Ejemplares similares