System-on-chip test architectures: nanometer design for testability

Bibliographic Details
Main Author: Wang, Laung-Terng (ed. by)
Other Authors: Stround, Charles E. Touba, Nur A.
Format: Printed Book
Language:English
Published: Boston Morgan Kaufmann 2008
Subjects:
Systems on a chip-Testing > Integrated circuits- very large scale integration- Testing
Description
Item Description:
Physical Description:xxxiii, 856p.
ISBN:9780123739735

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