Llwytho...
System-on-chip test architectures: nanometer design for testability
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| Awduron Eraill: | |
| Fformat: | Printed Book |
| Iaith: | English |
| Cyhoeddwyd: |
Boston
Morgan Kaufmann
2008
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| Pynciau: |
| Disgrifiad o'r Eitem: | |
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| Disgrifiad Corfforoll: | xxxiii, 856p. |
| ISBN: | 9780123739735 |