MOSFET modeling for circuit analysis and design

Bibliographic Details
Main Author: Galup-Montoro, Carlos
Other Authors: Schneider, Marcio Cherem
Format: Printed Book
Language:English
Published: New Jersey World Scientific 2007
Subjects:
Metel Oxide semiconductor field- effect transistor's

UL

Holdings details from UL
Call Number: 621.382.323 GAL
Copy Live Status Unavailable

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