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Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale
| Autor Principal: | |
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| Formato: | Printed Book |
| Idioma: | English |
| Publicado: |
New York
Springer
2007
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| Subjects: |
UL
| Número de Clasificación: |
621.385.833 KAL.1 621.385.833 KAL.2 |
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| Copia | Live Status Unavailable |
| Copia | Live Status Unavailable |