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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements

書目詳細資料
主要作者: Rupa R. Pai
其他作者: Sudha Kartha, C.
格式: Printed Book
語言:English
出版: Kochi Department of Physics, CUSAT 2004
主題:

UL

持有資料詳情 UL
索引號: 539.216.2 RUP
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