Nalaganje...
Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
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| Drugi avtorji: | |
| Format: | Printed Book |
| Jezik: | English |
| Izdano: |
Kochi
Department of Physics, CUSAT
2004
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| Teme: |
UL
| Signatura: |
539.216.2 RUP |
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| Kopija | Zaloga ni dosegljiva |