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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
| Главный автор: | |
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| Другие авторы: | |
| Формат: | Printed Book |
| Язык: | English |
| Опубликовано: |
Kochi
Department of Physics, CUSAT
2004
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| Предметы: |
UL
| Шифр: |
539.216.2 RUP |
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| Копировать | Недоступно состояние Live" What does mean the status Live (working) |