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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
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| Outros autores: | |
| Formato: | Printed Book |
| Idioma: | English |
| Publicado: |
Kochi
Department of Physics, CUSAT
2004
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| Subjects: |
UL
| Número de Clasificación: |
539.216.2 RUP |
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| Copia | Live Status Unavailable |