Á lódáil...
Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
| Príomhúdar: | |
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| Údair Eile: | |
| Formáid: | Printed Book |
| Teanga: | English |
| Foilsithe: |
Kochi
Department of Physics, CUSAT
2004
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| Ábhair: |
UL
| Gairmuimhir: |
539.216.2 RUP |
|---|---|
| Cóip | Live Status Unavailable |