Chargement en cours...
Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
| Auteur principal: | |
|---|---|
| Autres auteurs: | |
| Format: | Printed Book |
| Langue: | English |
| Publié: |
Kochi
Department of Physics, CUSAT
2004
|
| Sujets: |
UL
| Cote: |
539.216.2 RUP |
|---|---|
| Exemplaire | Statut en temps réel indisponible |