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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
| Egile nagusia: | |
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| Beste egile batzuk: | |
| Formatua: | Printed Book |
| Hizkuntza: | English |
| Argitaratua: |
Kochi
Department of Physics, CUSAT
2004
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| Gaiak: |
UL
| Sailkapena: |
539.216.2 RUP |
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| Alea | Egoera zuzenean ez dago erabilgarri |