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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
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| Format: | Printed Book |
| Sprache: | English |
| Veröffentlicht: |
Kochi
Department of Physics, CUSAT
2004
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| Schlagworte: |
UL
| Signatur: |
539.216.2 RUP |
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| Exemplar | Live-Status nicht verfügbar |