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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
Hovedforfatter: | |
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Andre forfattere: | |
Format: | Printed Book |
Sprog: | English |
Udgivet: |
Kochi
Department of Physics, CUSAT
2004
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Fag: |
UL
Klassifikationsnummer: |
539.216.2 RUP |
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Kopi | Live Status Unavailable |