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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements

Bibliografiske detaljer
Hovedforfatter: Rupa R. Pai
Andre forfattere: Sudha Kartha, C.
Format: Printed Book
Sprog:English
Udgivet: Kochi Department of Physics, CUSAT 2004
Fag:

UL

Detaljer om beholdninger fra UL
Klassifikationsnummer: 539.216.2 RUP
Kopi Live Status Unavailable