Carregant...
Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
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| Altres autors: | |
| Format: | Printed Book |
| Idioma: | English |
| Publicat: |
Kochi
Department of Physics, CUSAT
2004
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| Matèries: |
UL
| Signatura: |
539.216.2 RUP |
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| Còpia | Comprovació en temps real no disponible |