Caricamento...
Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
| Autore principale: | |
|---|---|
| Altri autori: | |
| Natura: | Printed Book |
| Lingua: | English |
| Pubblicazione: |
Kochi
Department of Physics, CUSAT
2004
|
| Soggetti: |
Search Result 1