Cargando...
Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
| Autor Principal: | |
|---|---|
| Outros autores: | |
| Formato: | Printed Book |
| Idioma: | English |
| Publicado: |
Kochi
Department of Physics, CUSAT
2004
|
| Subjects: |
Search Result 1