Cargando...
Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
| Autor principal: | |
|---|---|
| Otros Autores: | |
| Formato: | Printed Book |
| Lenguaje: | English |
| Publicado: |
Kochi
Department of Physics, CUSAT
2004
|
| Materias: |
Search Result 1