Carregant...
Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
| Autor principal: | |
|---|---|
| Altres autors: | |
| Format: | Printed Book |
| Idioma: | English |
| Publicat: |
Kochi
Department of Physics, CUSAT
2004
|
| Matèries: |
Search Result 1