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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements

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Sonraí Bibleagrafaíochta
Príomhúdar:	Rupa R. Pai
Údair Eile:	Sudha Kartha, C.
Formáid:	Printed Book
Teanga:	English
Foilsithe:	Kochi Department of Physics, CUSAT 2004
Ábhair:	Semiconducting thin films

Míreanna Comhchosúla

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