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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements

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Xehetasun bibliografikoak
Egile nagusia:	Rupa R. Pai
Beste egile batzuk:	Sudha Kartha, C.
Formatua:	Printed Book
Hizkuntza:	English
Argitaratua:	Kochi Department of Physics, CUSAT 2004
Gaiak:	Semiconducting thin films

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