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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements

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Manylion Llyfryddiaeth
Prif Awdur:	Rupa R. Pai
Awduron Eraill:	Sudha Kartha, C.
Fformat:	Printed Book
Iaith:	English
Cyhoeddwyd:	Kochi Department of Physics, CUSAT 2004
Pynciau:	Semiconducting thin films

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