Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements

Podobné jednotky

• Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
  Autor: Rupa, R. Pai
  Vydáno: (2004)
• Intermetallic semiconducting films
  Autor: Wieder, H H
  Vydáno: (1970)
• Semiconducting Transparent Thin Films
  Autor: Hartnagel,H L
  Vydáno: (1995)
• Studies on thermoelectric semiconducting oxide materials
  Autor: Ramachandran T
• Semiconducting and metallic polymers
  Autor: Heeger, Alan J
  Vydáno: (2010)