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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
| 主要作者: | |
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| 其他作者: | |
| 格式: | Printed Book |
| 語言: | English |
| 出版: |
Kochi
Department of Physics, CUSAT
2004
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| 主題: |
UL
| 索引號: |
539.216.2 RUP |
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| 復印件 | Live Status Unavailable |