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20151026132143.0 |
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960221s1955 dcuabcdjdbkoqu001 0deng d |
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|a Adlib
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|a 539.216.2
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245 |
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|a Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
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250 |
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260 |
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|a Kochi
|b Department of Physics, CUSAT
|c 2004
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|a xviii, 182p.
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|a Thesis (Ph.D), CUSAT, 2004
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|a Rupa R. Pai
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700 |
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|a Sudha Kartha, C.
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942 |
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|c REF
|6 _
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653 |
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|a Semiconducting thin films
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999 |
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|c 42767
|d 42767
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|0 0
|1 0
|4 0
|6 5392162_RUP
|7 0
|9 54852
|a UL
|b UL
|d 2010-06-16
|o 539.216.2 RUP
|p G0008659
|r 2010-06-16
|w 2010-06-16
|y REF
|