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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements

Bibliografiske detaljer
Hovedforfatter: Rupa R. Pai
Andre forfattere: Sudha Kartha, C.
Format: Printed Book
Sprog:English
Udgivet: Kochi Department of Physics, CUSAT 2004
Fag:
LEADER 00796nam a2200253 a 4500
001 adlib96000001
003 ViArRB
005 20151026132143.0
008 960221s1955 dcuabcdjdbkoqu001 0deng d
020
022
040 |a Adlib 
082 |a 539.216.2 
245 |a Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements 
250
260 |a Kochi  |b Department of Physics, CUSAT  |c 2004 
300 |a xviii, 182p. 
500 |a  Thesis (Ph.D), CUSAT, 2004 
100 |a Rupa R. Pai 
700 |a Sudha Kartha, C. 
942 |c REF  |6 _ 
653 |a Semiconducting thin films 
999 |c 42767  |d 42767 
952 |0 0  |1 0  |4 0  |6 5392162_RUP  |7 0  |9 54852  |a UL  |b UL  |d 2010-06-16  |o 539.216.2 RUP  |p G0008659  |r 2010-06-16  |w 2010-06-16  |y REF