Lanean...
Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
| Egile nagusia: | |
|---|---|
| Beste egile batzuk: | |
| Formatua: | Printed Book |
| Hizkuntza: | English |
| Argitaratua: |
Kochi
Department of Physics, CUSAT
2004
|
| Gaiak: |
| Alearen deskribapena: | Thesis (Ph.D), CUSAT, 2004 |
|---|---|
| Deskribapen fisikoa: | xviii, 182p. |