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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
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| Formato: | Printed Book |
| Lenguaje: | English |
| Publicado: |
Kochi
Department of Physics, CUSAT
2004
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| Materias: |
| Notas: | Thesis (Ph.D), CUSAT, 2004 |
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| Descripción Física: | xviii, 182p. |