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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements

Manylion Llyfryddiaeth
Prif Awdur: Rupa R. Pai
Awduron Eraill: Sudha Kartha, C.
Fformat: Printed Book
Iaith:English
Cyhoeddwyd: Kochi Department of Physics, CUSAT 2004
Pynciau:
Disgrifiad
Disgrifiad o'r Eitem: Thesis (Ph.D), CUSAT, 2004
Disgrifiad Corfforoll:xviii, 182p.