APA引文

Rupa R. Pai & Sudha Kartha, C. (2004). Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements. Department of Physics, CUSAT.

Chicago Edition Citation

Rupa R. Pai and C. Sudha Kartha. Analysis and Identification of Traps in Some Binary Semiconducting Thin Films Using Thermally Stimulated Current Measurements. Kochi: Department of Physics, CUSAT, 2004.

MLA引文

Rupa R. Pai and C. Sudha Kartha. Analysis and Identification of Traps in Some Binary Semiconducting Thin Films Using Thermally Stimulated Current Measurements. Department of Physics, CUSAT, 2004.

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