एपीए उद्धरण

Rupa R. Pai & Sudha Kartha, C. (2004). Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements. Department of Physics, CUSAT.

शिकागो स्टाइल उद्धरण

Rupa R. Pai और C. Sudha Kartha. Analysis and Identification of Traps in Some Binary Semiconducting Thin Films Using Thermally Stimulated Current Measurements. Kochi: Department of Physics, CUSAT, 2004.

एमएलए उद्धरण

Rupa R. Pai और C. Sudha Kartha. Analysis and Identification of Traps in Some Binary Semiconducting Thin Films Using Thermally Stimulated Current Measurements. Department of Physics, CUSAT, 2004.