Rupa R. Pai & Sudha Kartha, C. (2004). Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements. Department of Physics, CUSAT.
Style de citation ChicagoRupa R. Pai et C. Sudha Kartha. Analysis and Identification of Traps in Some Binary Semiconducting Thin Films Using Thermally Stimulated Current Measurements. Kochi: Department of Physics, CUSAT, 2004.
Style de citation MLARupa R. Pai et C. Sudha Kartha. Analysis and Identification of Traps in Some Binary Semiconducting Thin Films Using Thermally Stimulated Current Measurements. Department of Physics, CUSAT, 2004.
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