Rupa R. Pai & Sudha Kartha, C. (2004). Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements. Department of Physics, CUSAT.
Παραπομπή Chicago StyleRupa R. Pai και C. Sudha Kartha. Analysis and Identification of Traps in Some Binary Semiconducting Thin Films Using Thermally Stimulated Current Measurements. Kochi: Department of Physics, CUSAT, 2004.
Παραπομπή MLARupa R. Pai και C. Sudha Kartha. Analysis and Identification of Traps in Some Binary Semiconducting Thin Films Using Thermally Stimulated Current Measurements. Department of Physics, CUSAT, 2004.
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