Rupa R. Pai & Sudha Kartha, C. (2004). Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements. Department of Physics, CUSAT.
Styl ChicagoRupa R. Pai a C. Sudha Kartha. Analysis and Identification of Traps in Some Binary Semiconducting Thin Films Using Thermally Stimulated Current Measurements. Kochi: Department of Physics, CUSAT, 2004.
Citace podle MLARupa R. Pai a C. Sudha Kartha. Analysis and Identification of Traps in Some Binary Semiconducting Thin Films Using Thermally Stimulated Current Measurements. Department of Physics, CUSAT, 2004.
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