VLSI test principles and architectures: design for testability

Détails bibliographiques
Auteur principal: Wang, laung-Terng [ed.] (ed. by)
Autres auteurs: Cheng-Wu [ed.], Xiaoqing Wen [ed.]
Format: Printed Book
Langue:English
Publié: Amsterdam Elsevier 2006
Collection:(Morgan Kaufmann series in systems on silicon)
Sujets:
Integrated circuits-very large scale integration-testing > Integrated circuits-very large scale integration-design

Documents similaires

Documents similaires