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VLSI test principles and architectures: design for testability

Bibliografski detalji
Glavni autor:	Wang, laung-Terng [ed.] (ed. by)
Daljnji autori:	Cheng-Wu [ed.], Xiaoqing Wen [ed.]
Format:	Printed Book
Jezik:	English
Izdano:	Amsterdam Elsevier 2006
Serija:	(Morgan Kaufmann series in systems on silicon)
Teme:	Integrated circuits-very large scale integration-testing > Integrated circuits-very large scale integration-design

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