載入...
VLSI test principles and architectures: design for testability
主要作者: | Wang, laung-Terng [ed.] (ed. by) |
---|---|
其他作者: | Cheng-Wu [ed.], Xiaoqing Wen [ed.] |
格式: | Printed Book |
語言: | English |
出版: |
Amsterdam
Elsevier
2006
|
叢編: | (Morgan Kaufmann series in systems on silicon)
|
主題: |
相似書籍
-
VLSI handbook
由: Giacomo, Joseph Di, Ed
出版: (1989) -
Basic VLSI design
由: Pucknell,Douglas A
出版: (2008) -
VLSI design
由: Kishore, Lal K
出版: (2011) -
System-on-chip test architectures: nanometer design for testability
由: Wang, Laung-Terng
出版: (2008) -
VLSI technology
由: Sze, S.M
出版: (2005)