VLSI test principles and architectures: design for testability

Detalles Bibliográficos
Autor Principal: Wang, laung-Terng [ed.] (ed. by)
Outros autores: Cheng-Wu [ed.], Xiaoqing Wen [ed.]
Formato: Printed Book
Idioma:English
Publicado: Amsterdam Elsevier 2006
Series:(Morgan Kaufmann series in systems on silicon)
Subjects:
Integrated circuits-very large scale integration-testing > Integrated circuits-very large scale integration-design
Descripción
Descrición Física:xxx, 777p.
ISBN:0-12-370597-5

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