Stochastic models in reliability /

Bibliographic Details
Main Author: Aven, T.
Other Authors: Aven, T.; Jensen, Uwe
Format: Printed Book
Language:English
Published: New York : Springer, c1999.
Subjects:
Stochastic process- reliability

MAT

Holdings details from MAT
Call Number: 519.248 AVE
Copy Live Status Unavailable

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