Á lódáil...
Non-destructive evaluation of ion implanted semiconductor thin films using photothermal deflection spectroscopy
| Príomhúdar: | |
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| Údair Eile: | |
| Formáid: | Printed Book |
| Teanga: | English |
| Foilsithe: |
Cochin:
Cochin University of Science and Techonology,
2004.
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| Ábhair: |
PHY
| Gairmuimhir: |
PH. D |
|---|---|
| Cóip | Live Status Unavailable |