Cargando...
Non-destructive evaluation of ion implanted semiconductor thin films using photothermal deflection spectroscopy
| Autor Principal: | |
|---|---|
| Outros autores: | |
| Formato: | Printed Book |
| Idioma: | English |
| Publicado: |
Cochin:
Cochin University of Science and Techonology,
2004.
|
| Subjects: |
PHY
| Número de Clasificación: |
PH. D |
|---|---|
| Copia | Live Status Unavailable |