Loading...
Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
| Hovedforfatter: | |
|---|---|
| Andre forfattere: | |
| Format: | Printed Book |
| Sprog: | English |
| Udgivet: |
Cochin:
Cochin University of Science and Technology,
2004.
|
| Fag: |
| Fysisk beskrivelse: | Ph. D |
|---|