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The electrical characterization of semiconductors : measurement of minority carrier properties
| 主要作者: | |
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| 其他作者: | |
| 格式: | Printed Book |
| 语言: | English |
| 出版: |
New York:
Academic Press,
1990
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| 丛编: | Techniques of physics;
13 |
| 主题: |
PHY
| 索引号: |
621.381/52 ORT |
|---|---|
| 复印件 | Live Status Unavailable |