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Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /

Bibliografske podrobnosti
Korporativna značnica: International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany
Drugi avtorji: Donecker, J., ed, Rechenberg, I., ed
Format: Printed Book
Jezik:English
Izdano: Bristol ; Institute of Physics Pub., 1998.
Serija:Institute of physics series; no. 160
Teme:
Opis
Fizični opis:xx, 524 p. : ill. ; 24 cm.
ISBN:0750305002