Loading...

Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /

Bibliographic Details
Corporate Author: International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany
Other Authors: Donecker, J., ed, Rechenberg, I., ed
Format: Printed Book
Language:English
Published: Bristol ; Institute of Physics Pub., 1998.
Series:Institute of physics series; no. 160
Subjects:
Description
Physical Description:xx, 524 p. : ill. ; 24 cm.
ISBN:0750305002