Electron and ion microscopy and microanalysis : principles and applications /

Bibliographic Details
Main Author: Murr, Lawrence Eugene
Format: Printed Book
Language:English
Published: New York : Marcel Dekker, c1982.
Series:Optical engineering (Marcel Dekker, Inc.) ; v. 1.
Subjects:
Electron microscopy > Field ion microscopy > Microprobe analysis

PHY

Holdings details from PHY
Call Number: 502/.8/25 MUR
502/.8/25 MUR;1
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