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Electron and ion microscopy and microanalysis : principles and applications /
| Hovedforfatter: | |
|---|---|
| Format: | Printed Book |
| Sprog: | English |
| Udgivet: |
New York :
Marcel Dekker,
c1982.
|
| Serier: | Optical engineering (Marcel Dekker, Inc.) ;
v. 1. |
| Fag: |
| Fysisk beskrivelse: | xiv, 793 p. : ill. ; 27 cm. |
|---|---|
| ISBN: | 0824715535 |