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Electron and ion microscopy and microanalysis : principles and applications /
| Main Author: | |
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| Format: | Printed Book |
| Language: | English |
| Published: |
New York :
Marcel Dekker,
c1982.
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| Series: | Optical engineering (Marcel Dekker, Inc.) ;
v. 1. |
| Subjects: |
| Physical Description: | xiv, 793 p. : ill. ; 27 cm. |
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| ISBN: | 0824715535 |